Canemco & Marivac

 Products for Electron Microscopy and Histology

 

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Graticules for Stereology


In its simplest form, Stereology is the science where information about a three dimensional object is obtained from only a two-dimensional section of that structure.
Measurements are usually made with these graticules in the following manner:

  1. An adequate representation of sections from a specimen is obtained.

  2. The graticule is superimposed upon the specimen   (or micrograph / projected image of the section)

  3. Finally, the interaction between the superimposed graticule and the test sections are recorded.


 

The Mertz Graticules (36 point) - NGM1


Used to estimate the three dimensional surface areas of the surface density of a component in a given volume, when the component does not have a random orientation. It comprises a test system with parallel curved lines used for measuring the intersection of points.

 

 

Catalog # Description Dia Qty
8077-16  NGM1   Mertz Graticules (36 point)  16 mm Each

8077-19

NGM1   Mertz Graticules (36 point)

19 mm

Each

8077-21

NGM1   Mertz Graticules (36 point)

21 mm

Each

Please use the catalog number and description when ordering.


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Weibel 1 - NGW1

 


15 lines of equal length connecting the verticals of a regular hexagonal point network.


Reference: E. R. Weibel Lab. Invest. Vol 22. pp131-152
Principles and Methods for the Morphometric Study of the Lungs and Other Organs.

 

 

Catalog # Description Dia Qty
8078-16  Weibel 1 - NGW1  16mm  Each

8078-19

Weibel 1 - NGW1

19 mm

Each

8078-21

Weibel 1 - NGW1

21 mm

Each

Please use the catalog number and description when ordering.


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Weibel 2 - NGW2

 

Used when making a surface to volume ratio of a structure per mass unit. This graticule consists of a number of short lines with interruptions the same length as the lines. Basically, the number of intersections falling over the short lines are counted and the number of endpoints falling on the end of the structure are determined.

Reference: E.R.Weibel, Journal of Microscopy Vol. 95.pp373-378Current Capabilities and Limitation of Available Stereological Techniques, point counting method
 

Catalog # Description Dia Qty
8079-16

Weibel 2 - NGW2

16mm Each

8079-19

Weibel 2 - NGW2

19 mm

Each

8079-21

Weibel 2 - NGW2

21 mm

Each

Please use the catalog number and description when ordering.

 

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Lines and Cross Lines  |  Square Grids & Indexed Grids  | Horizontal and Vertical Scales

| Concentric Circles |  Particle Sizing  |  Metallurgy |  Stereology  | Stage Micrometers

Stage Calibration Standards | Stage Volume counting

 

 

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