MAG*I*CAL^® Calibration Standard

MAG*I*CAL^®

^{Calibration Reference Standard for TEM}

The  MAG*I*CAL^® was developed in a world-class Canadian Solid State Physics laboratory to perform the three major calibrations for transmission electron microscopy.

• The image magnification calibration – All TEM magnification ranges

• The camera constant calibrations (indexing diffraction patterns)

• The image/diffraction pattern rotation calibration

 

• Directly traceable to a natural constant

MAG*I*CAL^®  is the world’s smallest ruler and has been inducted into

The Guinness Book of World Records.

 

The MAG*I*CAL® offers real advantages over other calibration samples:

• It is directly traceable to the crystal lattice constant of silicon. This constant can be measured directly on the MAG*I*CAL® sample, providing unbroken traceability to a fundamental constant of nature.
   

• Instead of 4-6 calibration samples to cover all the magnification ranges on a TEM, the MAG*I*CAL® calibration standard covers all ranges with one sample, offering unparalleled accuracy and consistency.
   

• The MAG*I*CAL® can also be used for the electron diffraction (camera constant) calibration, as well as the calibration of the rotation between the image and diffraction pattern.
   

• No other calibration sample can rival the accuracy, reliability and traceability of the MAG*I*CAL®.

Magnification Calibration Standard for TEM

MAG*I*CAL^® calibration reference standard for TEM consists of an ion-milled cross-section of a silicon wafer on which a series of calibration marks were deposited. The spacing between these calibration marks are very accurately known. When the calibration structure is viewed in a TEM, it appears as a series of light (silicon) and dark layers (SiGe).The calibration thickness measurements of the light and dark layers are  based on careful TEM measurements of the <111> lattice spacing of silicone, which is visible on the calibration sample itself and are supported by X-ray diffraction measurements. The layer spacing are designed so the sample can be used to calibrate the entire magnification range in TEM from 1,000X to 1,000,000X.

 

As the sample is also a single crystal of silicone, the calibrations requiring electron diffraction information, such as the camera constant and image/diffraction pattern rotation can also be performed easily.

 

One single calibration sample can therefore be used to provide all three of the major TEM instrument calibrations at all magnifications and all camera lengths

 

 

 

Diagram of the MAG*I*CAL^®  Grid.

 

 

 

The arrows on the drawing and photograph indicate the four regions on the standard where the calibration marks may be found.

 

 

 

canliv@canemco.com                                  1-877-633-0550